Students Dae Hyun Kang and Seung Hoon Kim (M.S.& Ph.D. integrated program) from Professor Byung Jin Cho’s Research Lab have been honored with the Best Oral Presentation Award at the 2025 Summer Conference of the Korean Institute of Electrical and Electronic Material Engineers (KIEEME).
The KIEEME Summer Conference is one of the most prestigious academic events in Korea for the fields of electronic materials and semiconductors. It serves as a key venue for sharing the latest research achievements, discussing industrial trends, and promoting academic–industrial collaboration.
Dae Hyun Kang presented a paper titled “Performance Enhancement of Charge Trap Flash Memory via Silicon-Doped Boron Nitride Energy Barrier,” while Sheung Hun Kim presented “Analysis of Disturbance Behavior through Lanthanum Interface Treatment in Hafnium Oxide Ferroelectric-Based FeFET Memory.”
Both presentations received high evaluations for originality, technical completeness, and contributions to both academia and industry, leading them to be jointly awarded the Best Oral Presentation Award.
This achievement is particularly significant as it highlights the breakthrough potential of advanced charge trap memory and FeFET memory technologies in overcoming performance limitations and improving device reliability, gaining strong recognition from both academia and industry.
