Heegon Kim and Sukjin Kim from Professor Joungho Kim’s research group received the Best Paper Award at the 2015 IEEE Symposium on EMC & SI 2015.
*Name of the Conference : 2015 IEEE Symposium on Electromagnetic Compatibility & Signal Integrity (EMC & SI 2015)
*Date : March 15, 2015 ~ March 20, 2015
*Venue : Santa Clara, USA
*Award Title : Best Paper Award
*Paper Title : On-Chip Linear Voltage Regulator Module (VRM) Effect on Power Distribution Network (PDN) Noise and Jitter at High-Speed Output Buffer