With the importance of information security increasing daily, the importance of physical layer security is increasing along with upper layer security. In recent years, owing to technological advancements such as higher accuracy and lower cost of measuring instruments, higher processing speed of computers, and increasing storage capacity of digital devices, advanced attacks that were previously difficult to implement have been realized. Furthermore, such threats have now extended to general commercial products as well as military applications and diplomatic domains. Hence, in this talk, I would like to introduce the issue of information security degradation through electromagnetic fields, which is a physical security attack that cannot be easily detected. I would also like to introduce the associated mechanism of security degradation by electromagnetic fields, corresponding countermeasures, and standardization trends.
Yuichi Hayashi received the M.S. and Ph.D. degrees in Information Sciences from Tohoku University, Sendai, Japan, in 2005 and 2009, respectively. He is currently a Professor of Nara Institute of Science and Technology. His research interests include electromagnetic compatibility and information security. He is the Chair of EM Information Leakage Subcommittee in IEEE EMC Technical Committee 5. Prof. Hayashi has been recognized through many awards and honors including the IEEE International Symposium on Electromagnetic Compatibility Best Symposium Paper Award (2013) and Workshop on Cryptographic Hardware and Embedded Systems Best Paper Award (2014).