Ph.D candidate Kim Seung Yun from Prof. Byung jin Cho’s group awarded the Best prize at the 7th Ram Research Korea Paper Competition.
This award cermony was held on December 19. The awarded paper is ‘Mechanical and electrical reliability analysis of flexible Si CMOS IC via structure optimization -Semiconductor process technology ; focusing on etching, thin flim deposition towards flexible electronics’.
Paper: Mechanical and electrical reliability analysis of flexible Si CMOS IC via structure optimization -Semiconductor process technology ; focusing on etching, thin flim deposition towards flexible electronics
Author: Ph.D candidate Kim Seung Yun, Prof. Cho Byung Jin
Prize: Grand Prize (1st Prize)
Congratulations to Kim Seung Yun.
